Invention Grant
- Patent Title: Operating surface characterization for integrated circuits
- Patent Title (中): 集成电路的工作表面特性
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Application No.: US14168177Application Date: 2014-01-30
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Publication No.: US09291670B2Publication Date: 2016-03-22
- Inventor: Preminder Singh , Sung Wook Kang
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Agent Gareth M. Sampson; Lawrence J. Merkel
- Main IPC: H01L25/00
- IPC: H01L25/00 ; G01R31/30 ; G06F1/32 ; G01R31/28 ; H01L21/66

Abstract:
A device includes an integrated circuit programmed with an operating surface equation. The operating surface equation may define an operating point as a function of operating voltage, operating frequency, and leakage current. The operating surface equation may be generated by fitting a surface equation to data for operating voltage and operating frequency versus leakage current for a plurality of test integrated circuits. An operating voltage of the integrated circuit at a given operating frequency may be determined by the operating surface equation and a leakage current value fused into the device.
Public/Granted literature
- US20150212120A1 OPERATING SURFACE CHARACTERIZATION FOR INTEGRATED CIRCUITS Public/Granted day:2015-07-30
Information query
IPC分类: