Invention Grant
- Patent Title: Semiconductor structure including stacked structure and method for forming the same
- Patent Title (中): 包括堆叠结构的半导体结构及其形成方法
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Application No.: US14143040Application Date: 2013-12-30
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Publication No.: US09293348B2Publication Date: 2016-03-22
- Inventor: Erh-Kun Lai , Guan-Ru Lee , Yen-Hao Shih
- Applicant: Macronix International Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee: MACRONIX INTERNATIONAL CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: H01L23/528
- IPC: H01L23/528 ; H01L27/105 ; H01L23/522 ; H01L21/3213 ; H01L21/3205 ; H01L21/768 ; H01L29/792 ; H01L27/115 ; H01L29/423 ; H01L29/66

Abstract:
A semiconductor structure and a method for forming the same are provided. The semiconductor structure includes a substrate, a stacked structure, a dielectric layer, a conductive structure, a dielectric structure and a conductive plug. The stacked structure includes dielectric films and conductive films arranged alternately. The dielectric layer is between the conductive structure and a sidewall of the stacked structure. The dielectric structure is on the stacked structure and defining a through via. The conductive plug fills the through via and physically contacts one of the conductive films exposed by the through via and adjoined with the dielectric layer.
Public/Granted literature
- US20150187694A1 SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME Public/Granted day:2015-07-02
Information query
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