Invention Grant
US09298946B2 Physically unclonable function based on breakdown voltage of metal-insulator-metal device 有权
基于金属绝缘体金属器件击穿电压的物理不可克隆功能

Physically unclonable function based on breakdown voltage of metal-insulator-metal device
Abstract:
One feature pertains to a method of implementing a physically unclonable function that includes providing an array of metal-insulator-metal (MIM) devices, where the MIM devices are configured to represent a first resistance state or a second resistance state and a plurality of the MIM devices are initially at the first resistance state. The MIM devices have a random breakdown voltage that is greater than a first voltage and less than a second voltage, where the breakdown voltage represents a voltage that causes the MIM devices to transition from the first resistance state to the second resistance state. The method further includes applying a signal line voltage to the MIM devices to cause a portion of the MIM devices to randomly breakdown and transition from the first resistance state to the second resistance state, the signal line voltage greater than the first voltage and less than the second voltage.
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