Invention Grant
US09303312B2 Film deposition apparatus with low plasma damage and low processing temperature
有权
膜沉积设备具有低等离子体损伤和低加工温度
- Patent Title: Film deposition apparatus with low plasma damage and low processing temperature
- Patent Title (中): 膜沉积设备具有低等离子体损伤和低加工温度
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Application No.: US14188689Application Date: 2014-02-25
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Publication No.: US09303312B2Publication Date: 2016-04-05
- Inventor: Kai-An Wang , Craig W. Marion , Efrain A. Velazquez , Michael Z. Wong , Albert Ting , Jingru Sun
- Applicant: Areesys Technologies, Inc.
- Applicant Address: US CA Fremont
- Assignee: Areesys Technologies, Inc.
- Current Assignee: Areesys Technologies, Inc.
- Current Assignee Address: US CA Fremont
- Agency: SV Patent Service
- Main IPC: H01J37/34
- IPC: H01J37/34 ; C23C14/35

Abstract:
A deposition system includes a magnetron sputter deposition source that includes a backing frame that includes a window and a closed loop around the window. The backing frame includes inside surfaces towards the window, one or more sputtering targets mounted on inside surfaces of the backing frame, and one or more magnets mounted on outside surfaces of the backing frame. The one or more sputtering targets include sputtering surfaces that define internal walls of the window. The one or more magnets can produce a magnetic field near the one or more sputtering surfaces. A substrate includes a deposition surface oriented towards the window in the backing frame. The deposition surface receives sputtering material(s) from the one or more sputtering targets.
Public/Granted literature
- US20140251799A1 Film Deposition Apparatus with Low Plasma Damage and Low Processing Temperature Public/Granted day:2014-09-11
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