Invention Grant
- Patent Title: Method of fabricating semiconductor package
- Patent Title (中): 制造半导体封装的方法
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Application No.: US14640464Application Date: 2015-03-06
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Publication No.: US09305899B2Publication Date: 2016-04-05
- Inventor: Jae-Yong Park , Jun-Young Ko , Sang-Jun Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: EIPG, PLLC
- Priority: KR10-2013-0020632 20130226
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L21/768 ; H01L23/31 ; H01L21/48 ; H01L21/56 ; H01L23/498 ; H01L21/78 ; H01L25/00

Abstract:
A method of fabricating a semiconductor package includes providing a wafer which includes an upper area having through silicon vias (TSVs) and a lower area not having the TSVs; mounting a semiconductor chip on the upper area of the wafer; forming a passivation layer to a predetermined thickness to cover the semiconductor chip; exposing the TSVs by removing the lower area of the wafer in a state where no support is attached to the wafer; and exposing a top surface of the semiconductor chip by partially removing the passivation layer.
Public/Granted literature
- US20150179625A1 METHOD OF FABRICATING SEMICONDUCTOR PACKAGE Public/Granted day:2015-06-25
Information query
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