Invention Grant
- Patent Title: Impedance analyzing device
- Patent Title (中): 阻抗分析装置
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Application No.: US13891882Application Date: 2013-05-10
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Publication No.: US09322884B2Publication Date: 2016-04-26
- Inventor: Yi-Feng Luo , Cihun-Siyong Gong
- Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Applicant Address: TW Hsinchu
- Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee Address: TW Hsinchu
- Agency: Locke Lord LLP
- Agent Tim Tingkang Xia, Esq.
- Priority: TW101100639A 20120106; TW102100332A 20130104
- Main IPC: G01R31/36
- IPC: G01R31/36 ; G01R27/02

Abstract:
An impedance analyzing device, adapted to a testee comprising an electrode or at least one battery cell, includes a signal capturing unit, a signal adjusting unit, a signal analyzing unit, a processing unit, and a power source supply unit providing a variable-frequency voltage signal to the testee. The signal adjusting unit receiving and adjusts a variable-frequency voltage signal and the current signal to generate an adjusted variable-frequency voltage signal and an adjusted current signal. The signal capturing unit captures a current signal generated by the testee in response to the variable-frequency voltage signal. The signal analyzing unit receives and analyzes the adjusted variable-frequency voltage signal and the adjusted current signal in frequency domain to obtain a frequency domain parameter and/or a time domain parameter. The processing unit receives the frequency domain parameter and/or the time domain parameter to obtain an impedance variation characteristic of the testee.
Public/Granted literature
- US20130253862A1 IMPEDANCE ANALYZING DEVICE Public/Granted day:2013-09-26
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