Invention Grant
- Patent Title: Plasma processing method and plasma processing apparatus
- Patent Title (中): 等离子体处理方法和等离子体处理装置
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Application No.: US14426671Application Date: 2013-09-20
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Publication No.: US09324542B2Publication Date: 2016-04-26
- Inventor: Naoki Matsumoto , Yugo Tomita , Naoki Mihara , Kazuki Takahashi , Michitaka Aita , Jun Yoshikawa , Takahiro Senda , Yoshiyasu Sato , Kazuyuki Kato , Kenji Sudou , Hitoshi Mizusugi
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Priority: JP2012-224095 20121009; JP2012-273664 20121214
- International Application: PCT/JP2013/075555 WO 20130920
- International Announcement: WO2014/057793 WO 20140417
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L21/461 ; H01J37/32 ; H01L21/3065 ; H01L21/311

Abstract:
In a plasma processing apparatus of an exemplary embodiment, energy of microwaves is introduced from an antenna into the processing container through a dielectric window. The plasma processing apparatus includes a central introducing unit and a peripheral introducing unit. A central introduction port of the central introducing unit injects a gas just below the dielectric window. A plurality of peripheral introduction ports of the peripheral introducing unit injects a gas towards a periphery of the placement region. The central introducing unit is connected to with a plurality of first gas sources including a reactive gas source and a rare gas source through a plurality of first flow rate control units. The peripheral introducing unit is connected to with a plurality of second gas sources including a reactive gas source and a rare gas source through a plurality of second flow rate control units.
Public/Granted literature
- US20150228459A1 PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS Public/Granted day:2015-08-13
Information query
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