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US09324811B2 Structures and devices including a tensile-stressed silicon arsenic layer and methods of forming same 有权
包括拉伸应力硅砷层的结构和器件及其形成方法

Structures and devices including a tensile-stressed silicon arsenic layer and methods of forming same
Abstract:
Structures including a tensile-stressed silicon arsenic layer, devices including the structures, and methods of forming the devices and structures are disclosed. Exemplary tensile-stressed silicon arsenic layer have an arsenic doping level of greater than 5 E+20 arsenic atoms per cubic centimeter. The structures can be used to form metal oxide semiconductor devices.
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