Invention Grant
- Patent Title: Automatic analyzer
- Patent Title (中): 自动分析仪
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Application No.: US14422278Application Date: 2013-07-11
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Publication No.: US09335335B2Publication Date: 2016-05-10
- Inventor: Tomonori Mimura , Kumiko Kamihara , Isao Yamazaki , Hideto Tamezane
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2012-188062 20120828
- International Application: PCT/JP2013/069049 WO 20130711
- International Announcement: WO2014/034293 WO 20140306
- Main IPC: G01N33/00
- IPC: G01N33/00 ; G01N35/00 ; G01N35/10

Abstract:
Provided is an automatic analyzer capable of detecting not only clogging and air suction of the dispensation probe but also a decrease in the dispensation quantity caused by a bubble film, air bubbles or a highly viscous sample. Each of a sample/reagent suction operation time and a sample/reagent discharge operation time of a probe is segmented into multiple time sections. For each of the time sections determined by the segmentation, a parameter is calculated by applying a detected pressure waveform to an approximation formula. For each of the time section, the presence/absence of a dispensation abnormality is judged by comparing the calculated parameter with a parameter in cases of normal dispensation. An automatic analyzer capable of judging the presence/absence of an abnormality specific to each time section and making abnormality judgments difficult for conventional techniques can be realized.
Public/Granted literature
- US20150219680A1 AUTOMATIC ANALYZER Public/Granted day:2015-08-06
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