Invention Grant
- Patent Title: Adjustable magnetic probe for efficient near field scanning
- Patent Title (中): 可调磁探头,用于高效近场扫描
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Application No.: US14037142Application Date: 2013-09-25
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Publication No.: US09335384B2Publication Date: 2016-05-10
- Inventor: Kyu-Pyung Hwang , Young K. Song , Dong Wook Kim , Changhan Hobie Yun
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Arent Fox LLP
- Main IPC: G01R33/02
- IPC: G01R33/02 ; G01R29/08

Abstract:
A method and apparatus for testing near field magnetic fields of electronic devices. The method comprises measuring a magnetic field using a loop antenna that is oriented in a first direction. The loop antenna is swept through a desired range of azimuth angles while measuring the magnetic field. Once the first direction testing is completed, the loop antenna is changed to a second orientation direction. The magnetic field is then measured in the second orientation direction and is swept through a desired range of orientation angles in the second direction. The apparatus provides a loop antenna connected to a coaxial probe, with the coaxial cable serving as the center conductor, and two outer conductors. An axle is mounted to the loop antenna and connected to a step motor. A servo motor is also provided for moving the arm assembly.
Public/Granted literature
- US20150084623A1 ADJUSTABLE MAGNETIC PROBE FOR EFFICIENT NEAR FIELD SCANNING Public/Granted day:2015-03-26
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