Invention Grant
- Patent Title: Apparatus and methods for locating source of and analyzing electromagnetic radiation
- Patent Title (中): 用于定位和分析电磁辐射源的装置和方法
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Application No.: US14531247Application Date: 2014-11-03
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Publication No.: US09335398B2Publication Date: 2016-05-10
- Inventor: Byron G. Zollars , Steve M. Savoy , Michael W. Mayo , Daniel R. Mitchell
- Applicant: Nanohmics, Inc.
- Applicant Address: US TX Austin
- Assignee: Nanohmics, Inc.
- Current Assignee: Nanohmics, Inc.
- Current Assignee Address: US TX Austin
- Agency: Murphy Strategic IP
- Agent George L. Murphy
- Main IPC: H01L27/14
- IPC: H01L27/14 ; G01S3/782 ; G01S3/781 ; G01J1/42 ; G01J1/04 ; G01S3/784 ; H01L31/0232 ; H01L27/146 ; G01J3/28
Abstract:
Method and apparatus for determining direction from which electromagnetic radiation originates and spectral characteristics of the radiation are provided. Lenses, diffraction gratings, which may be present on the surface of the lenses, and mirrors direct radiation to a photodetector. Lens and grating parameters, along with the location, size, relative spacing and orientation of diffracted orders of radiation detected by the photodetector are used for determining direction from which the radiation originates.
Public/Granted literature
- US20150331082A1 Apparatus and Methods for Locating Source Of and Analyzing Electromagnetic Radiation Public/Granted day:2015-11-19
Information query
IPC分类:
