Compact mapping spectrometer
    3.
    发明授权

    公开(公告)号:US10254164B2

    公开(公告)日:2019-04-09

    申请号:US15099085

    申请日:2016-04-14

    Abstract: A compact, mapping spectrometer and various embodiments of the spectrometer are described. Methods for performing high-resolution spectroscopic, spatial, and polarimetric analyses of electromagnetic radiation across the complete electromagnetic spectrum, using spectrometer embodiments of the invention, are also described. The spectrometer and associated methods are useful for producing spectral and hyperspectral images associated with the incoming radiation and for identifying other information about electromagnetic radiation of interest.

    Compact Mapping Spectrometer
    6.
    发明申请
    Compact Mapping Spectrometer 审中-公开
    小型映射光谱仪

    公开(公告)号:US20160305820A1

    公开(公告)日:2016-10-20

    申请号:US15099085

    申请日:2016-04-14

    Abstract: A compact, mapping spectrometer and various embodiments of the spectrometer are described. Methods for performing high-resolution spectroscopic, spatial, and polarimetric analyses of electromagnetic radiation across the complete electromagnetic spectrum, using spectrometer embodiments of the invention, are also described. The spectrometer and associated methods are useful for producing spectral and hyperspectral images associated with the incoming radiation and for identifying other information about electromagnetic radiation of interest.

    Abstract translation: 描述了紧凑的映射光谱仪和光谱仪的各种实施例。 还描述了使用本发明的光谱仪实施例对整个电磁光谱进行电磁辐射的高分辨率光谱,空间和极化分析的方法。 光谱仪和相关方法可用于产生与入射辐射相关的光谱和高光谱图像,并用于识别关于感兴趣的电磁辐射的其他信息。

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