Invention Grant
US09361977B2 Reliable read operation for nonvolatile memory device with resistance material that reads data based on reference current
有权
对具有基于参考电流读取数据的电阻材料的非易失性存储器件进行可靠的读取操作
- Patent Title: Reliable read operation for nonvolatile memory device with resistance material that reads data based on reference current
- Patent Title (中): 对具有基于参考电流读取数据的电阻材料的非易失性存储器件进行可靠的读取操作
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Application No.: US14612997Application Date: 2015-02-03
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Publication No.: US09361977B2Publication Date: 2016-06-07
- Inventor: Mu-Hui Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2014-0012619 20140204
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00 ; G11C11/56 ; G11C29/02

Abstract:
Provided is a nonvolatile memory device. The nonvolatile memory device may include a resistive memory cell, a reference current generator which provides a reference current, a reference signal generator which provides a reference signal indicating a reference time for data read based on the reference current, and a read circuit which receives the reference signal and reads data by comparing a ramp-up time of a cell current flowing through the resistive memory cell with the reference time.
Public/Granted literature
- US20150221365A1 NONVOLATILE MEMORY DEVICE USING RESISTANCE MATERIAL Public/Granted day:2015-08-06
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