Invention Grant
- Patent Title: Semiconductor devices having through-vias and methods for fabricating the same
-
Application No.: US14566828Application Date: 2014-12-11
-
Publication No.: US09362172B2Publication Date: 2016-06-07
- Inventor: Kyu-Ha Lee , Ho-Jin Lee , Pil-Kyu Kang , Byung Lyul Park , Hyunsoo Chung , Gilheyun Choi
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel & Sibley
- Priority: KR10-2012-0014360 20120213
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/522 ; H01L23/48 ; H01L25/065 ; H01L23/00 ; H01L23/31

Abstract:
The inventive concept provides semiconductor devices having through-vias and methods for fabricating the same. The method may include forming a via-hole opened toward a top surface of a substrate and partially penetrating the substrate, forming a via-insulating layer having a first thickness on a bottom surface of the via-hole and a second thickness smaller than the first thickness on an inner sidewall of the via-hole, forming a through-via in the via-hole which the via-insulating layer is formed in, and recessing a bottom surface of the substrate to expose the through-via. Forming the via-insulating layer may include forming a flowable layer on the substrate, and converting the flowable layer into a first flowable chemical vapor deposition layer having the first thickness on the bottom surface of the via-hole.
Public/Granted literature
- US20150093896A1 SEMICONDUCTOR DEVICES HAVING THROUGH-VIAS AND METHODS FOR FABRICATING THE SAME Public/Granted day:2015-04-02
Information query
IPC分类: