发明授权
- 专利标题: Electromigration-aware layout generation
- 专利标题(中): 电迁移感知布局生成
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申请号: US14218147申请日: 2014-03-18
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公开(公告)号: US09367660B2公开(公告)日: 2016-06-14
- 发明人: Nitesh Katta , Jerry Chang-Jui Kao , Chin-Shen Lin , Yi-Chuin Tsai , Chien-Ju Chao , Kuo-Nan Yang , Chung-Hsing Wang
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: WPAT, P.C., Intellectual Property Attorneys
- 代理商 Anthony King
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
In some embodiments, in a method, cell layouts of a plurality of cells are received. For each cell, a respective constraint that affects a geometry of an interconnect to be coupled to an output pin of the cell in a design layout is determined based on a geometry of the output pin of the cell in the cell layout.
公开/授权文献
- US20150269302A1 ELECTROMIGRATION-AWARE LAYOUT GENERATION 公开/授权日:2015-09-24
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