A system, method, and tangible computer readable medium for chip debug is disclosed. For example, the system can include a plurality of functional blocks, a debug path, and a debug bus steering module. The debug path couples the plurality of functional blocks in a daisy chain configuration, where an end functional block from the plurality of functional blocks is at an end of the daisy chain configuration. The debug bus steering module is configured to pass one or more debug signals associated with a first functional block from the plurality of functional blocks along the debug path to the end functional block while a second functional block from the plurality of functional blocks performs one or more power gating cycles.