发明授权
US09378817B2 Variable resistance nonvolatile memory element writing method and variable resistance nonvolatile memory device
有权
可变电阻非易失性存储元件写入方法和可变电阻非易失性存储器件
- 专利标题: Variable resistance nonvolatile memory element writing method and variable resistance nonvolatile memory device
- 专利标题(中): 可变电阻非易失性存储元件写入方法和可变电阻非易失性存储器件
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申请号: US13581925申请日: 2012-03-22
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公开(公告)号: US09378817B2公开(公告)日: 2016-06-28
- 发明人: Ken Kawai , Kazuhiko Shimakawa , Yoshikazu Katoh
- 申请人: Ken Kawai , Kazuhiko Shimakawa , Yoshikazu Katoh
- 申请人地址: JP Osaka
- 专利权人: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- 当前专利权人: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- 当前专利权人地址: JP Osaka
- 代理机构: Wenderoth, Lind & Ponack, L.L.P.
- 优先权: JP2011-068556 20110325
- 国际申请: PCT/JP2012/001975 WO 20120322
- 国际公布: WO2012/132341 WO 20121004
- 主分类号: G11C11/00
- IPC分类号: G11C11/00 ; G11C13/00
摘要:
A variable resistance nonvolatile memory element writing method of, by applying a voltage pulse to a memory cell including a variable resistance element, reversibly changing the variable resistance element between a first resistance state and a second resistance state according to a polarity of the applied voltage pulse is provided. The variable resistance nonvolatile memory element writing method includes applying a first preliminary voltage pulse and subsequently applying the first voltage pulse to the variable resistance element to change the variable resistance element from the second resistance state to the first resistance state, the first preliminary voltage pulse being smaller in voltage absolute value than the second threshold voltage and different in polarity from the first voltage pulse.
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