Invention Grant
- Patent Title: Fin formation in fin field effect transistors
- Patent Title (中): 翅片场效应晶体管中的鳍形成
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Application No.: US14584790Application Date: 2014-12-29
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Publication No.: US09379218B2Publication Date: 2016-06-28
- Inventor: Kangguo Cheng , Bruce B. Doris , Hong He , Ali Khakifirooz , Yunpeng Yin
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Tutunjian & Bitetto, P.C.
- Agent Vazken Alexanian
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/225 ; H01L29/78

Abstract:
A method of forming a semiconductor device that includes forming a silicon including fin structure and forming a germanium including layer on the silicon including fin structure. Germanium is then diffused from the germanium including layer into the silicon including fin structure to convert the silicon including fin structure to silicon germanium including fin structure.
Public/Granted literature
- US20150311320A1 FIN FORMATION IN FIN FIELD EFFECT TRANSISTORS Public/Granted day:2015-10-29
Information query
IPC分类: