Invention Grant
- Patent Title: Functional built-in self test for a chip
- Patent Title (中): 功能内置自检芯片
-
Application No.: US13693236Application Date: 2012-12-04
-
Publication No.: US09384108B2Publication Date: 2016-07-05
- Inventor: Kevin M. McIlvain , Robert B. Tremaine , Gary Van Huben
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Main IPC: G06F9/455
- IPC: G06F9/455 ; G01R31/28 ; G06F11/00 ; G06F11/27

Abstract:
According to one embodiment, a self-test system integrated on a chip is provided, the chip including a functional logic module for performing a selected application. The self-test system includes a primary interface a primary interface to the functional logic module, the primary interface configured to interface with a primary device, an input interface protocol generator for generating a pattern to be inserted into the primary interface and a secondary interface to the functional logic module, the secondary interface configured to interface with a secondary device. The system also includes an emulator engine coupled to the secondary interface, the emulator engine for testing a function of the functional logic module based on the inserted patterns, the function being configured to communicate with a secondary device coupled to the secondary interface, wherein the emulator engine tests the function when no secondary device is coupled to the chip.
Public/Granted literature
- US20140156253A1 FUNCTIONAL BUILT-IN SELF TEST FOR A CHIP Public/Granted day:2014-06-05
Information query