Invention Grant
US09384315B2 Method, system and computer program product for electrical and thermal analysis at a substrate level
有权
用于基板级电气和热分析的方法,系统和计算机程序产品
- Patent Title: Method, system and computer program product for electrical and thermal analysis at a substrate level
- Patent Title (中): 用于基板级电气和热分析的方法,系统和计算机程序产品
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Application No.: US14325088Application Date: 2014-07-07
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Publication No.: US09384315B2Publication Date: 2016-07-05
- Inventor: Mattia Monetti , Alberto Balzarotti
- Applicant: STMicroelectronics S.r.l.
- Applicant Address: IT Agrate Brianza
- Assignee: STMICROELECTRONICS S.R.L.
- Current Assignee: STMICROELECTRONICS S.R.L.
- Current Assignee Address: IT Agrate Brianza
- Agency: Gardere Wynne Sewell LLP
- Priority: ITTO2013A0575 20130709
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A method for the automatic design of an electronic circuit includes operations for evaluation of the thermal effects in the electronic circuit. The method generates a layout of the electronic circuit. Abstract data at the substrate level associated to the layout of the electronic circuit is then generated. A grid of partitioning is generated with respect to a view regarding the aforesaid abstract into meshes and nodes. The grid is applied to the substrate. On the basis of the grid (TG), a list of nodes or netlist representing a thermal network that represents the thermal behavior of the substrate or of its portions or elements is extracted. The netlist is useful in simulation operations, in particular of a SPICE type, for making an evaluation of thermal effects in the electronic circuit.
Public/Granted literature
- US20150020040A1 METHOD FOR AUTOMATIC DESIGN OF AN ELECTRONIC CIRCUIT, CORRESPONDING SYSTEM AND COMPUTER PROGRAM PRODUCT Public/Granted day:2015-01-15
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