发明授权
US09390785B2 Method, apparatus and system for determining a write recovery time of a memory based on temperature
有权
用于基于温度确定存储器的写恢复时间的方法,装置和系统
- 专利标题: Method, apparatus and system for determining a write recovery time of a memory based on temperature
- 专利标题(中): 用于基于温度确定存储器的写恢复时间的方法,装置和系统
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申请号: US14227969申请日: 2014-03-27
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公开(公告)号: US09390785B2公开(公告)日: 2016-07-12
- 发明人: John B. Halbert , Kuljit S. Bains
- 申请人: John B. Halbert , Kuljit S. Bains
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely, Sokoloff, Taylor & Zafman LLP
- 主分类号: G11C11/4076
- IPC分类号: G11C11/4076 ; G11C11/4094 ; G11C7/04 ; G11C11/406
摘要:
Techniques and mechanisms for determining a write recovery time of a memory device. In an embodiment, thermal detection logic detects a signal from a thermal sensor indicating a temperature state of a resource of the memory device. A value of a write recovery parameter is set based on the signal from the thermal sensor. In another embodiment, command logic generates a signal to precharge one or more cells of the memory device. The write recovery parameter is used by timer logic to control a timing of the signal to precharge the one or more cells.
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