Invention Grant
- Patent Title: N-type and P-type tunneling field effect transistors (TFETs)
- Patent Title (中): N型和P型隧道场效应晶体管(TFET)
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Application No.: US14521200Application Date: 2014-10-22
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Publication No.: US09412872B2Publication Date: 2016-08-09
- Inventor: Roza Kotlyar , Stephen M. Cea , Gilbert Dewey , Benjamin Chu-Kung , Uygar E. Avci , Rafael Rios , Anurag Chaudhry , Thomas D. Linton, Jr. , Ian A. Young , Kelin J. Kuhn
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/739 ; H01L29/16 ; H01L29/161 ; H01L29/06 ; H01L29/24 ; H01L29/267

Abstract:
Tunneling field effect transistors (TFETs) for CMOS architectures and approaches to fabricating N-type and P-type TFETs are described. For example, a tunneling field effect transistor (TFET) includes a homojunction active region disposed above a substrate. The homojunction active region includes a relaxed Ge or GeSn body having an undoped channel region therein. The homojunction active region also includes doped source and drain regions disposed in the relaxed Ge or GeSn body, on either side of the channel region. The TFET also includes a gate stack disposed on the channel region, between the source and drain regions. The gate stack includes a gate dielectric portion and gate electrode portion.
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