发明授权
US09428485B2 Salt, photoresist composition and method for producing photoresist pattern
有权
盐,光致抗蚀剂组合物和制造光致抗蚀剂图案的方法
- 专利标题: Salt, photoresist composition and method for producing photoresist pattern
- 专利标题(中): 盐,光致抗蚀剂组合物和制造光致抗蚀剂图案的方法
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申请号: US13491370申请日: 2012-06-07
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公开(公告)号: US09428485B2公开(公告)日: 2016-08-30
- 发明人: Tatsuro Masuyama , Yuichi Mukai
- 申请人: Tatsuro Masuyama , Yuichi Mukai
- 申请人地址: JP Tokyo
- 专利权人: SUMITOMO CHEMICAL COMPANY, LIMITED
- 当前专利权人: SUMITOMO CHEMICAL COMPANY, LIMITED
- 当前专利权人地址: JP Tokyo
- 代理机构: Birch, Stewart, Kolasch & Birch, LLP
- 优先权: JP2011-128920 20110609; JP2011-166769 20110729; JP2011-277196 20111219
- 主分类号: G03F7/028
- IPC分类号: G03F7/028 ; C07D321/10 ; C07C309/10 ; C07C309/12 ; C07C381/12 ; G03F7/004 ; G03F7/039 ; G03F7/11 ; G03F7/20
摘要:
A salt represented by formula (I): wherein Q1 and Q2 each independently represent a fluorine atom or a C1-C6 perfluoroalkyl group, A1 represents a C1-C30 monovalent organic group, X1 represents a C1-C10 aliphatic hydrocarbon group where a hydrogen atom may be replaced by a hydroxy group, m1 and m2 independently each represent an integer of 1 to 4, and Z+ represents an organic cation.
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