METHOD FOR PREPARING PIXEL DEFINE LAYER

    公开(公告)号:US20250063896A1

    公开(公告)日:2025-02-20

    申请号:US18808465

    申请日:2024-08-19

    Abstract: Provided is a single process of performing coating; prebaking; exposure; and development for implementing a coloring pattern capable of reducing the process time on an electrode substrate by integrating the two processes of layers of PDL and CS of an organic light-emitting diode panel into one, which can reduce scratches caused by a metal mask during deposition by managing the half-tone thickness to 1.25 to 2.20 μm and the full-tone thickness to be 3.20 to 3.40 μm, and form a pattern by adjusting the UV active line transmittance of the photomask to three sections of 0% (non-exposed portion), 15 to 60% (half-tone), and 100% (full-tone), creating a step height of the pattern after the development process is completed, while including a coloring agent.

    PHOTOSENSITIVE RESIN MULTILAYER BODY
    7.
    发明公开

    公开(公告)号:US20230375930A1

    公开(公告)日:2023-11-23

    申请号:US18030668

    申请日:2021-09-24

    CPC classification number: G03F7/094 G03F7/115 G03F7/039 G03F7/038 G03F7/028

    Abstract: The present disclosure provides a photosensitive resin multilayer body which comprises a support film and a photosensitive resin layer that is superposed on the support film. The photosensitive resin layer contains from 30% by mass to 70% by mass of an alkali-soluble polymer, from 20% by mass to 50% by mass of a compound that has an ethylenically unsaturated double bond, and from 0.01% by mass to 20% by mass of a photopolymerization initiator. The alkali-soluble polymer has an acid equivalent weight of 350 or more, while containing, as a copolymerization component, a (meth)acrylate that has an aromatic group. The compound that has an ethylenically unsaturated double bond contains from 50% by mass to 100% by mass of an acrylate monomer based on the total mass of the compound, while having a double-bond equivalent weight of 150 or more. The photosensitive resin layer has a thickness of 30 μm or more.

    RESIST MIXTURE
    9.
    发明公开
    RESIST MIXTURE 审中-公开

    公开(公告)号:US20230324799A1

    公开(公告)日:2023-10-12

    申请号:US18324825

    申请日:2023-05-26

    Inventor: Ryan GUTERMAN

    CPC classification number: G03F7/0757 G03F7/028 G03F7/0752

    Abstract: A resist mixture for manufacturing an ion-conductor. In some examples the mixture is crosslinkable and comprises: a polymer comprising siloxane; a crosslinker; and a salt comprising a cationic component, and an anionic component. In other examples the mixture is polymerisable and comprises: a polymer comprising siloxane; a monomer; and a salt comprising a cationic component, and an anionic component. At least one of the cationic component or the anionic component is bonded to the polymer.

    ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE

    公开(公告)号:US20230168581A1

    公开(公告)日:2023-06-01

    申请号:US18159380

    申请日:2023-01-25

    CPC classification number: G03F7/039 G03F7/028

    Abstract: An object of the present invention is to provide an actinic ray-sensitive or radiation-sensitive resin composition by which a pattern having excellent LWR performance can be formed. In addition, another object of the present invention is to provide a resist film, a pattern forming method, and a method for manufacturing an electronic device, each relating to the actinic ray-sensitive or radiation-sensitive resin composition.
    The actinic ray-sensitive or radiation-sensitive resin composition according to an embodiment of the present invention is an actinic ray-sensitive or radiation-sensitive resin composition including an acid-decomposable resin including a repeating unit having an acid-decomposable group in which an acid group having a pKa of 13 or less is protected by a leaving group that leaves by an action of an acid, and one or more compounds that generate an acid upon irradiation with actinic rays or radiation, which are selected from a compound (I) and a compound (II),
    in which the content of the acid-decomposable resin is 10% by mass or more with respect to a total solid content of the composition,
    the content of the compounds that generate an acid upon irradiation with actinic rays or radiation is 10% by mass or more with respect to the total solid content of the composition, and
    the acid-decomposable resin has a halogen atom in a repeating unit other than the repeating unit having a group that generates an acid upon irradiation with actinic rays or radiation.

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