Invention Grant
- Patent Title: Scalable and uniformity controllable diffusion plasma source
- Patent Title (中): 可扩展和均匀可控扩散等离子体源
-
Application No.: US14209695Application Date: 2014-03-13
-
Publication No.: US09431218B2Publication Date: 2016-08-30
- Inventor: Jianping Zhao , Lee Chen , Radha Sundararajan , Merritt Funk
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Main IPC: H05B39/00
- IPC: H05B39/00 ; H01J37/32

Abstract:
A method of treating a substrate with plasma is described. In particular, the method includes disposing a substrate in a plasma processing system, disposing a hollow cathode plasma source including at least one hollow cathode within the plasma processing system, and disposing a grid between the cathode outlet of the plurality of hollow cathodes and the substrate. The method further includes electrically coupling the grid to electrical ground, coupling a voltage to the at least one hollow cathode relative to electrical ground, and generating plasma in hollow cathode by ion-induced secondary electron emission of energetic electrons that move along a first trajectory, and diffusing lower energy electrons along a second trajectory across a first region of the interior space between the cathode outlet and the grid, through the grid, and into a second region of the interior space in fluid contact with the substrate.
Public/Granted literature
- US20140265846A1 SCALABLE AND UNIFORMITY CONTROLLABLE DIFFUSION PLASMA SOURCE Public/Granted day:2014-09-18
Information query