Invention Grant
US09442025B2 System and method for calibrating temperatures sensor for integrated circuits
有权
用于校准集成电路温度传感器的系统和方法
- Patent Title: System and method for calibrating temperatures sensor for integrated circuits
- Patent Title (中): 用于校准集成电路温度传感器的系统和方法
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Application No.: US14066942Application Date: 2013-10-30
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Publication No.: US09442025B2Publication Date: 2016-09-13
- Inventor: Yizhang Yang , Jun Zhai
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Agent Lawrence J. Merkel; Neal E. Persky
- Main IPC: G01K15/00
- IPC: G01K15/00 ; G01K3/04 ; G01K7/01

Abstract:
In some embodiments, a method may be provided for calibrating integrated circuit temperature sensors. The method may include sensing a first temperature using a first temperature sensor and a second temperature using a second temperature sensor. The first temperature sensor may be calibrated and is external to a package of the integrated circuit. The second temperature sensor may be included in the integrated circuit. The method may include increasing a temperature of the integrated circuit. The method may include allowing the integrated circuit and the package to thermally equilibrate over a first period of time. The method may include sensing a first slope of a temperature decay by the first temperature sensor. The method may include sensing a second slope of a temperature decay by the second temperature sensor. The method may include calibrating the second temperature sensor responsive to a difference between the first and second temperatures and the first and second slopes.
Public/Granted literature
- US20150117486A1 System and Method for Calibrating Temperatures Sensor for Integrated Circuits Public/Granted day:2015-04-30
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