Invention Grant
- Patent Title: Optical particle analysis
- Patent Title (中): 光学粒子分析
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Application No.: US14606848Application Date: 2015-01-27
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Publication No.: US09448156B2Publication Date: 2016-09-20
- Inventor: Faris Modawar
- Applicant: Moxtek, Inc.
- Applicant Address: US UT Orem
- Assignee: Moxtek, Inc.
- Current Assignee: Moxtek, Inc.
- Current Assignee Address: US UT Orem
- Agency: Thorpe, North & Western, LLP
- Main IPC: G01N21/21
- IPC: G01N21/21 ; G01N15/14 ; G01N21/53 ; G01N21/05
Abstract:
A system and method for determining particle size, shape, and/or quantity. The particle can alter the polarization state of two oppositely-polarized light beams, thus allowing the light beams to interfere with each other. An interference pattern from interference of the two light beams can be captured by a CCD. The interference pattern can be analyzed to determine size, shape, and/or quantity.
Public/Granted literature
- US20150268151A1 OPTICAL PARTICLE ANALYSIS Public/Granted day:2015-09-24
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