公开(公告)号：US09448156B2

公开(公告)日：2016-09-20

申请号：US14606848

申请日：2015-01-27

Applicant: Moxtek, Inc.

Inventor： Faris Modawar

IPC: G01N21/21 ,  G01N15/14 ,  G01N21/53 ,  G01N21/05

CPC classification number: G01N15/1436 ,  G01N15/1468 ,  G01N21/05 ,  G01N21/21 ,  G01N21/53 ,  G01N2015/1454 ,  G01N2015/1493 ,  G01N2015/1497 ,  G01N2021/216

Abstract: A system and method for determining particle size, shape, and/or quantity. The particle can alter the polarization state of two oppositely-polarized light beams, thus allowing the light beams to interfere with each other. An interference pattern from interference of the two light beams can be captured by a CCD. The interference pattern can be analyzed to determine size, shape, and/or quantity.

Abstract translation: 用于确定粒度，形状和/或数量的系统和方法。 颗粒可以改变两个相对偏振光束的偏振状态，从而允许光束彼此干涉。 可以通过CCD捕获来自两个光束的干涉的干涉图案。 可以分析干涉图案以确定尺寸，形状和/或数量。

公开(公告)号：US20150268151A1

公开(公告)日：2015-09-24

申请号：US14606848

申请日：2015-01-27

Applicant: Moxtek, Inc.

Inventor： Faris Modawar

IPC: G01N15/14 ,  G01N21/53 ,  G01N21/05 ,  G01N21/21

CPC classification number: G01N15/1436 ,  G01N15/1468 ,  G01N21/05 ,  G01N21/21 ,  G01N21/53 ,  G01N2015/1454 ,  G01N2015/1493 ,  G01N2015/1497 ,  G01N2021/216

Abstract: A system and method for determining particle size, shape, and/or quantity. The particle can alter the polarization state of two oppositely-polarized light beams, thus allowing the light beams to interfere with each other. An interference pattern from interference of the two light beams can be captured by a CCD. The interference pattern can be analyzed to determine size, shape, and/or quantity.

Abstract translation: 用于确定粒度，形状和/或数量的系统和方法。 颗粒可以改变两个相对偏振光束的偏振状态，从而允许光束彼此干涉。 可以通过CCD捕获来自两个光束的干涉的干涉图案。 可以分析干涉图案以确定尺寸，形状和/或数量。