Invention Grant
- Patent Title: Gas analyzing apparatus
- Patent Title (中): 气体分析仪
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Application No.: US14578666Application Date: 2014-12-22
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Publication No.: US09448179B2Publication Date: 2016-09-20
- Inventor: Yusuke Mizuno , Takuji Oida , Misato Arakawa
- Applicant: HORIBA, Ltd.
- Applicant Address: JP Kyoto
- Assignee: HORIBA, LTD.
- Current Assignee: HORIBA, LTD.
- Current Assignee Address: JP Kyoto
- Agency: Brooks Kushman P.C.
- Priority: JP2013-273411 20131227
- Main IPC: G01N7/00
- IPC: G01N7/00 ; G01N21/00 ; G01N27/00 ; G01N31/00 ; G01N33/00 ; G01N17/00 ; G01N21/76

Abstract:
A gas analyzing apparatus includes a gas analyzing unit, a luminescence inducing component generating unit, and a measurement signal calculating unit. The gas analyzing unit receives a sample gas containing a component gas and/or a standard gas and the luminescence inducing gas. The gas analyzing unit is configured to output a detection signal based on an intensity of a reaction light generated by the interaction between the component gas and the luminescence inducing component. The luminescence inducing component generating unit generates the luminescence inducing gas by electric discharge generated repeatedly at specified intervals. The measurement signal calculating unit calculates a first measurement signal based on a first detection signal, based on the reaction light generated when the sample gas and the luminescence inducing gas are introduced, and a second detection signal, based on the reaction light generated when the standard gas and the luminescence inducing gas are introduced.
Public/Granted literature
- US20150185157A1 GAS ANALYZING APPARATUS Public/Granted day:2015-07-02
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