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公开(公告)号:US11131639B2
公开(公告)日:2021-09-28
申请号:US16447497
申请日:2019-06-20
Applicant: HORIBA, LTD.
Inventor: Yusuke Mizuno , Tomoki Aoyama , Erika Matsumoto , Shunsuke Murata , Toshiyuki Michikita
IPC: G01N23/223 , G01T7/04
Abstract: To more accurately output a signal related to a source of particulate matter floating in the atmosphere, an analyzer is equipped with a mass concentration measuring unit, an element analysis unit, and a source-related signal output unit. The mass concentration measuring unit measures the mass concentration of fine particulate matter (FP) in the atmosphere. The element analysis unit analyzes an element contained in the FP. The source-related signal output unit outputs a signal related to the source of the FP on the basis of the mass concentration measurement result from the mass concentration measuring unit, and the analysis result for the element contained in the FP from the element analysis unit.
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公开(公告)号:US09594037B2
公开(公告)日:2017-03-14
申请号:US14715812
申请日:2015-05-19
Applicant: HORIBA, LTD.
Inventor: Yusuke Mizuno , Tomoki Aoyama
IPC: G01N23/223 , G01T7/04 , G01T7/00 , G01N1/22 , G01N15/06
CPC classification number: G01N23/223 , G01N1/2205 , G01N15/0625 , G01N2223/651 , G01T7/005 , G01T7/04
Abstract: In an analyzing apparatus for analyzing compositions using a fluorescent X-ray in the atmosphere, a calibration to eliminate influences caused by a time-dependent change is performed. The analyzing apparatus includes an emission unit, a detection unit, an environment measurement unit, and a time-dependent change calculation unit. The emission unit emits a primary X-ray. The detection unit detects an intensity of a secondary X-ray passing through the atmosphere. The environment measurement unit measures an environment parameter defining the atmosphere. The time-dependent change calculation unit calculates a time-dependent change of the intensity of the secondary X-ray between a first timing and a second timing, based on a first environment parameter, a first intensity of the secondary X-ray, a second environment parameter, and a second intensity of the secondary X-ray.
Abstract translation: 在用于分析大气中的荧光X射线成分的分析装置中,进行用于消除由时间依赖性变化引起的影响的校准。 分析装置包括发射单元,检测单元,环境测量单元和时间变化计算单元。 发射单元发射主X射线。 检测单元检测通过大气的次级X射线的强度。 环境测量单元测量定义大气的环境参数。 时间依赖变化计算单元基于第一环境参数,次X射线的第一强度,第二次X射线的第二强度来计算第一定时和第二定时之间的次X射线的强度的时间依赖性变化 环境参数和次要X射线的第二强度。
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公开(公告)号:US11293885B2
公开(公告)日:2022-04-05
申请号:US16676862
申请日:2019-11-07
Applicant: HORIBA, LTD.
Inventor: Yusuke Mizuno , Tomoki Aoyama , Erika Matsumoto
IPC: G01N23/223 , G01N21/86 , G01N15/06 , G01N21/3563 , G01N23/2206 , G01N23/2204
Abstract: An analyzing apparatus includes an X-ray measurement device, an optical characteristic measurement device, and a calculation unit. The X-ray measurement device may be configured to measure fluorescent X-rays generated from the measurement object. The optical characteristic measurement device may be configured to obtain optical characteristics other than the fluorescent X-rays of one or more carbon compounds contained in the measurement object. The calculation unit may be configured to calculate information about a quantity of the one or more carbon compounds contained in the measurement object on the basis of the optical characteristics of the carbon compound(s), and correct the information about fluorescent X-rays measured by the X-ray measurement device on the basis of the information about the quantity of the carbon compound(s).
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公开(公告)号:US09962647B2
公开(公告)日:2018-05-08
申请号:US14735965
申请日:2015-06-10
Applicant: HORIBA, Ltd.
Inventor: Yusuke Mizuno , Shigeyuki Akiyama , Tomomichi Oka
IPC: B01D53/26 , G01N33/00 , G01N21/3504 , B01D53/04
CPC classification number: B01D53/261 , B01D53/04 , B01D2253/104 , B01D2253/106 , B01D2253/108 , B01D2253/116 , B01D2257/504 , B01D2257/80 , B01D2259/40088 , B01D2259/402 , G01N21/3504 , G01N33/004 , Y02A50/244 , Y02C10/08
Abstract: This invention provides a zero gas refiner for CO2 concentration measurement device that can continuously refine a zero gas that is preferable for CO2 concentration measurement. This invention adopts the zero gas refiner comprising a water adsorbent and a CO2 adsorbent that desorb an adsorbed component and restore an adsorption ability by being heated to a predetermined restoration temperature, a refiner body that adsorbs water and CO2 in an introduced sample gas or air in this order by the use of the water adsorbent and the CO2 adsorbent housed inside of the refiner body so as to refine a zero gas and that leads out the zero gas, and a heating mechanism that applies heat to the refiner body at a time when the adsorption ability of the water adsorbent or the CO2 adsorbent drops to an amount that is less than or equal to a predetermined amount.
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公开(公告)号:US09606249B2
公开(公告)日:2017-03-28
申请号:US14712841
申请日:2015-05-14
Applicant: HORIBA, Ltd.
Inventor: Yusuke Mizuno , Tomoki Aoyama
IPC: G01T7/00 , G01N23/223 , G01N1/22 , G01N15/06
CPC classification number: G01T7/005 , G01N1/2205 , G01N15/0612 , G01N23/223
Abstract: Calibration of an analyzing apparatus is performed using appropriate calibration data that reflects actual measurement conditions. The analyzing apparatus includes an emission unit, a collection filter, a calibration base material, a detection unit, and a composition analysis unit. The emission unit emits an exciting X-ray to generate a fluorescent X-ray by exciting particulate matter. The collection filter collects the particulate matter. The calibration base material is provided in a measurement area together with the collection filter when performing the calibration. The detection unit detects X-rays generated from the measurement area. The detection unit detects a calibration X-ray when performing the calibration. The composition analysis unit generates calibration data by using the calibration X-ray when performing the calibration. The composition analysis unit analyzes compositions of the particulate matter based on the calibration data and a measured X-ray detected by the detection unit when analyzing the compositions of the particulate matter.
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公开(公告)号:US09448179B2
公开(公告)日:2016-09-20
申请号:US14578666
申请日:2014-12-22
Applicant: HORIBA, Ltd.
Inventor: Yusuke Mizuno , Takuji Oida , Misato Arakawa
CPC classification number: G01N21/766 , G01N33/0026 , G01N2201/129
Abstract: A gas analyzing apparatus includes a gas analyzing unit, a luminescence inducing component generating unit, and a measurement signal calculating unit. The gas analyzing unit receives a sample gas containing a component gas and/or a standard gas and the luminescence inducing gas. The gas analyzing unit is configured to output a detection signal based on an intensity of a reaction light generated by the interaction between the component gas and the luminescence inducing component. The luminescence inducing component generating unit generates the luminescence inducing gas by electric discharge generated repeatedly at specified intervals. The measurement signal calculating unit calculates a first measurement signal based on a first detection signal, based on the reaction light generated when the sample gas and the luminescence inducing gas are introduced, and a second detection signal, based on the reaction light generated when the standard gas and the luminescence inducing gas are introduced.
Abstract translation: 气体分析装置包括气体分析单元,发光感应组件生成单元和测量信号计算单元。 气体分析单元接收含有成分气体和/或标准气体和发光诱导气体的样品气体。 气体分析单元被配置为基于由组分气体和发光诱导组件之间的相互作用产生的反应光的强度来输出检测信号。 发光诱导分量产生单元通过以规定的间隔重复产生的放电产生发光诱导气体。 测量信号计算单元基于当引入样品气体和发光诱导气体时产生的反应光,基于第一检测信号计算第一测量信号,并且基于当标准 引入气体和发光诱导气体。
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