Invention Grant
US09449677B2 Methods of operating and forming semiconductor devices including dual-gate electrode structures 有权
操作和形成包括双栅电极结构的半导体器件的方法

Methods of operating and forming semiconductor devices including dual-gate electrode structures
Abstract:
A semiconductor device may include a semiconductor substrate with first and second spaced apart source/drain regions defining a channel region therebetween and a control gate structure on the channel region between the first and second spaced apart source/drain regions. More particularly, the control gate structure may include a first gate electrode on the channel region adjacent the first source/drain region, and a second gate electrode on the channel region adjacent the second source/drain region. Moreover, the first and second gate electrodes may be electrically isolated. Related devices, structures, methods of operation, and methods of fabrication are also discussed.
Information query
Patent Agency Ranking
0/0