Invention Grant
- Patent Title: Methods of operating and forming semiconductor devices including dual-gate electrode structures
- Patent Title (中): 操作和形成包括双栅电极结构的半导体器件的方法
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Application No.: US14537387Application Date: 2014-11-10
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Publication No.: US09449677B2Publication Date: 2016-09-20
- Inventor: Jiyoung Kim , Yongchul Oh , Dongsoo Woo , Hyun-Woo Chung , Gyoyoung Jin , Sungkwan Choi , Hyeongsun Hong , Yoosang Hwang
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel & Sibley, P.A.
- Priority: KR10-2011-0060290 20110621
- Main IPC: G11C11/40
- IPC: G11C11/40 ; G11C11/4096 ; H01L27/108 ; G11C11/404 ; G11C11/408 ; H01L29/417 ; H01L29/423 ; H01L29/66 ; H01L29/78 ; H01L21/8234

Abstract:
A semiconductor device may include a semiconductor substrate with first and second spaced apart source/drain regions defining a channel region therebetween and a control gate structure on the channel region between the first and second spaced apart source/drain regions. More particularly, the control gate structure may include a first gate electrode on the channel region adjacent the first source/drain region, and a second gate electrode on the channel region adjacent the second source/drain region. Moreover, the first and second gate electrodes may be electrically isolated. Related devices, structures, methods of operation, and methods of fabrication are also discussed.
Public/Granted literature
- US20150055401A1 SEMICONDUCTOR DEVICES INCLUDING DUAL GATE ELECTRODE STRUCTURES AND RELATED METHODS Public/Granted day:2015-02-26
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