Invention Grant
- Patent Title: Methods and apparatus for calibrating for transconductance or gain over process or condition variations in differential circuits
- Patent Title (中): 用于校准差分电路中的跨导或增益过程或条件变化的方法和装置
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Application No.: US14595106Application Date: 2015-01-12
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Publication No.: US09450540B2Publication Date: 2016-09-20
- Inventor: Miao Li , Li Sun , Zhi Zhu
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Arent Fox LLP
- Main IPC: H03F3/45
- IPC: H03F3/45 ; H03F1/30 ; H03G3/30 ; H03K19/003 ; H03K19/0185
Abstract:
An apparatus is provided. The apparatus includes a calibration circuit configured to generate a reference signal and at least one differential circuit each being configured to operate at a calibrated transconductance over process or condition variations based on the reference signal. The calibration circuit may be configured to generate the reference signal independent of the at least one differential circuit. A method for operating at least one differential circuit is provided. The method includes generating a reference signal and operating the at least one differential circuit at a calibrated transconductance or gain over process or condition variations based on the reference signal. The reference signal may be generated independently of the at least one differential circuit.
Public/Granted literature
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