Invention Grant
US09464997B2 Methods and apparatuses for measuring effective atomic number of an object
有权
用于测量物体的有效原子序数的方法和装置
- Patent Title: Methods and apparatuses for measuring effective atomic number of an object
- Patent Title (中): 用于测量物体的有效原子序数的方法和装置
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Application No.: US14129669Application Date: 2012-12-28
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Publication No.: US09464997B2Publication Date: 2016-10-11
- Inventor: Shuwei Li , Zhiqiang Chen , Yuanjing Li , Ziran Zhao , Yinong Liu , Qingjun Zhang , Weibin Zhu , Yi Wang , Shuqing Zhao , Wenjian Zhang
- Applicant: Nuctech Company Limited , Tsinghua University
- Applicant Address: CN Beijing CN Beijing
- Assignee: Nuctech Company Limited,Tsinghua University
- Current Assignee: Nuctech Company Limited,Tsinghua University
- Current Assignee Address: CN Beijing CN Beijing
- Agency: Westman, Champlin & Koehler, P.A.
- Priority: CN201110457151 20111230
- International Application: PCT/CN2012/087849 WO 20121228
- International Announcement: WO2013/097768 WO 20130704
- Main IPC: G01N23/087
- IPC: G01N23/087 ; G01T1/22

Abstract:
Methods and apparatuses for measuring an effective atomic number of an object are disclosed. The apparatus includes: a ray source configured to product a first X-ray beam having a first energy and a second X-ray beam having a second energy; a Cherenkov detector configured to receive the first X-ray beam and the second X-ray beam that pass through an object under detection, and to generate a first detection value and a second detection value; and a data processing device configured to obtain an effective atomic number of the object based on the first detection value and the second detection value. The Cherenkov detector can eliminate disturbance of X-rays below certain energy threshold with respect to the object identification, and thus accuracy can be improved for object identification.
Public/Granted literature
- US20140314201A1 METHODS AND APPARATUSES FOR MEASURING EFFECTIVE ATOMIC NUMBER OF AN OBJECT Public/Granted day:2014-10-23
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