发明授权
- 专利标题： Device for measuring and controlling the wave-front of a coherent light beam
- 专利标题（中）： 用于测量和控制相干光束的波前的装置
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申请号： US14649511申请日： 2013-12-04
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公开(公告)号： US09466938B2公开(公告)日： 2016-10-11
- 发明人: Antoine Dupret , Sylvain Gigan , François Ramaz , Gilles Tessier , Arnaud Verdant
- 申请人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- 申请人地址： FR Paris
- 专利权人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- 当前专利权人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
- 当前专利权人地址： FR Paris
- 代理机构： Brannon Sowers & Cracraft PC
- 代理商 Kevin R. Erdman
- 优先权： FR1261594 20121204
- 国际申请： PCT/FR2013/052936 WO 20131204
- 国际公布： WO2014/087099 WO 20140612
- 主分类号： G02F1/13
- IPC分类号： G02F1/13 ; H01S3/00 ; G02F1/1343 ; G02F1/1335 ; G01J9/02 ; G02F1/133 ; G03H1/00 ; G02B26/06 ; G02F1/1347 ; G03H1/04 ; G03H1/02
摘要：
The invention concerns a system for measuring and controlling the wave-front of a coherent light beam (32), comprising: a device for generating a reference light beam (36) that is coherent with said coherent light beam (32); a partially reflective monolithic device (38) comprising an array of elementary cells, each elementary cell comprising at least one element (40) for measuring a portion of the incident wave interfering between the coherent light beam and the reference light beam and a phase modulation element (42) for modulating the phase of the reflected beam; and a control device (46) for controlling said phase modulation element making use of the information from the associated measuring element.
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