公开(公告)号：US11953381B2

公开(公告)日：2024-04-09

申请号：US17442976

申请日：2020-02-21

申请人： UNIVERSITE DE PARIS ,  SORBONNE UNIVERSITE ,  ECOLE POLYTECHNIQUE ,  CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE ,  COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES

发明人： Marc Guillon ,  Pascal Berto ,  Dimitris Papadopoulos ,  Gilles Tessier

IPC分类号： G01J9/00

CPC分类号： G01J9/00

摘要： A method for determining wavefront shapes of a multi-spectral signal light beam from a single signal image acquisition of said multi-spectral signal beam, with a device including an optical assembly made at least of an optical mask and an imaging sensor, notably a matrix imaging sensor, for generating and recording intensity patterns of incident beams, by having these beams reflect on, or propagate through, the optical mask. The optical mask having the optical properties: i) to cause the intensity pattern to depend on the wavefront shape, so that a tilt applied to the wavefront shape results in a displacement amount of the intensity pattern, and ii) to produce uncorrelated intensity patterns over at least one surface area A of the imaging sensor, for a plurality of respective incident monochrome beams of different wavelengths having a same wavefront shape.

公开(公告)号：US09466938B2

公开(公告)日：2016-10-11

申请号：US14649511

申请日：2013-12-04

申请人： COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES

发明人： Antoine Dupret ,  Sylvain Gigan ,  François Ramaz ,  Gilles Tessier ,  Arnaud Verdant

IPC分类号： G02F1/13 ,  H01S3/00 ,  G02F1/1343 ,  G02F1/1335 ,  G01J9/02 ,  G02F1/133 ,  G03H1/00 ,  G02B26/06 ,  G02F1/1347 ,  G03H1/04 ,  G03H1/02

CPC分类号： H01S3/0085 ,  G01J9/02 ,  G02B26/06 ,  G02F1/13318 ,  G02F1/133528 ,  G02F1/133553 ,  G02F1/13439 ,  G02F1/1347 ,  G02F2001/133531 ,  G02F2201/122 ,  G02F2201/123 ,  G02F2203/02 ,  G02F2203/12 ,  G02F2203/18 ,  G02F2203/50 ,  G03H1/0005 ,  G03H1/0443 ,  G03H2001/0224 ,  G03H2001/0445 ,  G03H2225/32 ,  G03H2226/11 ,  H01S3/005

摘要： The invention concerns a system for measuring and controlling the wave-front of a coherent light beam (32), comprising: a device for generating a reference light beam (36) that is coherent with said coherent light beam (32); a partially reflective monolithic device (38) comprising an array of elementary cells, each elementary cell comprising at least one element (40) for measuring a portion of the incident wave interfering between the coherent light beam and the reference light beam and a phase modulation element (42) for modulating the phase of the reflected beam; and a control device (46) for controlling said phase modulation element making use of the information from the associated measuring element.

摘要翻译： 本发明涉及一种用于测量和控制相干光束（32）的波前的系统，包括：用于产生与所述相干光束（32）相干的参考光束（36）的装置; 包括基本单元阵列的部分反射单体装置（38），每个单元包括至少一个元件（40），用于测量干涉相干光束和参考光束的入射波的一部分，以及相位调制元件 （42），用于调制反射光束的相位; 以及控制装置（46），用于使用来自相关联的测量元件的信息来控制所述相位调制元件。