Invention Grant
- Patent Title: Detection arrangement
- Patent Title (中): 检测布置
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Application No.: US14010145Application Date: 2013-08-26
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Publication No.: US09471792B2Publication Date: 2016-10-18
- Inventor: Soenke Ostertun , Joachim Christoph Hans Garbe
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP12182221 20120829
- Main IPC: G06F11/22
- IPC: G06F11/22 ; G06F17/50 ; G06F21/60 ; G06K19/073

Abstract:
There is provided a detection arrangement for detecting an attack to internal signals in a semiconductor device. The detection arrangement comprises a first input terminal, a second input terminal, and a comparison unit. The first input terminal is adapted to receive a first signal being indicative for a signal at a first stage of a driver of the semiconductor device, the driver being capable to drive signals internally to the semiconductor device. The second input terminal is adapted to receive a second signal being indicative for a signal at a second stage of the driver of the semiconductor device. The comparison unit is adapted to compare the first signal and the second signal and to determine a time period during which the signals are equal, wherein the determined time period is indicative for a potential attack, if the determined time period is above a predefined threshold.
Public/Granted literature
- US20140068762A1 DETECTION ARRANGEMENT Public/Granted day:2014-03-06
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