公开(公告)号：US20140068762A1

公开(公告)日：2014-03-06

申请号：US14010145

申请日：2013-08-26

Applicant: NXP B.V.

Inventor： Soenke Ostertun ,  Joachim Christoph Hans Garbe

IPC: G06F21/60

CPC classification number: G06F21/60 ,  G06K19/07372

Abstract: There is provided a detection arrangement for detecting an attack to internal signals in a semiconductor device. The detection arrangement comprises a first input terminal, a second input terminal, and a comparison unit. The first input terminal is adapted to receive a first signal being indicative for a signal at a first stage of a driver of the semiconductor device, the driver being capable to drive signals internally to the semiconductor device. The second input terminal is adapted to receive a second signal being indicative for a signal at a second stage of the driver of the semiconductor device. The comparison unit is adapted to compare the first signal and the second signal and to determine a time period during which the signals are equal, wherein the determined time period is indicative for a potential attack, if the determined time period is above a predefined threshold.

Abstract translation: 提供了用于检测对半导体器件中的内部信号的攻击的检测装置。 检测装置包括第一输入端子，第二输入端子和比较单元。 第一输入端子适于接收指示半导体器件的驱动器的第一级处的信号的第一信号，该驱动器能够在半导体器件内部驱动信号。 第二输入端子适于接收在半导体器件的驱动器的第二级指示信号的第二信号。 所述比较单元适于比较所述第一信号和所述第二信号，并且确定所述信号相等的时间段，其中如果所确定的时间段高于预定阈值，则确定的时间段指示潜在的攻击。

公开(公告)号：US09471792B2

公开(公告)日：2016-10-18

申请号：US14010145

申请日：2013-08-26

Applicant: NXP B.V.

Inventor： Soenke Ostertun ,  Joachim Christoph Hans Garbe

IPC: G06F11/22 ,  G06F17/50 ,  G06F21/60 ,  G06K19/073

CPC classification number: G06F21/60 ,  G06K19/07372

Abstract: There is provided a detection arrangement for detecting an attack to internal signals in a semiconductor device. The detection arrangement comprises a first input terminal, a second input terminal, and a comparison unit. The first input terminal is adapted to receive a first signal being indicative for a signal at a first stage of a driver of the semiconductor device, the driver being capable to drive signals internally to the semiconductor device. The second input terminal is adapted to receive a second signal being indicative for a signal at a second stage of the driver of the semiconductor device. The comparison unit is adapted to compare the first signal and the second signal and to determine a time period during which the signals are equal, wherein the determined time period is indicative for a potential attack, if the determined time period is above a predefined threshold.

Abstract translation: 提供了用于检测对半导体器件中的内部信号的攻击的检测装置。 检测装置包括第一输入端子，第二输入端子和比较单元。 第一输入端子适于接收指示半导体器件的驱动器的第一级处的信号的第一信号，该驱动器能够在半导体器件内部驱动信号。 第二输入端子适于接收在半导体器件的驱动器的第二级指示信号的第二信号。 所述比较单元适于比较所述第一信号和所述第二信号，并且确定所述信号相等的时间段，其中如果所确定的时间段高于预定阈值，则确定的时间段指示潜在的攻击。