Invention Grant
- Patent Title: MOS transistor and method for manufacturing MOS transistor
- Patent Title (中): MOS晶体管及制造MOS晶体管的方法
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Application No.: US14024872Application Date: 2013-09-12
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Publication No.: US09472665B2Publication Date: 2016-10-18
- Inventor: Chih-Chang Cheng , Fu-Yu Chu , Ruey-Hsin Liu
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: McDermott Will & Emery LLP
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L21/28 ; H01L29/49 ; H01L29/66 ; H01L29/06 ; H01L29/40

Abstract:
A novel MOS transistor, which includes a source region, a drain region, a channel region, an isolation region, a drift region, a gate dielectric layer, a gate electrode and a field plate, is provided. The gate electrode has a first portion and a second portion. The first portion of a first conductivity type is located over the channel region and has a width equal to or greater than a distance of the gate electrode overlapped with the channel region. The second portion is un-doped and located over the isolation region. Accordingly, the MOS transistor allows higher process freedom saves production cost, as well as improves reliability.
Public/Granted literature
- US20150069507A1 MOS TRANSISTOR AND METHOD FOR MANUFACTURING MOS TRANSISTOR Public/Granted day:2015-03-12
Information query
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