Invention Grant
- Patent Title: Sample inspection apparatus and control method thereof
- Patent Title (中): 样品检查装置及其控制方法
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Application No.: US14528118Application Date: 2014-10-30
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Publication No.: US09476896B2Publication Date: 2016-10-25
- Inventor: Jin Soo Park , Soo Hong Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2014-0011406 20140129
- Main IPC: G01N1/00
- IPC: G01N1/00 ; G01N35/10 ; G01N35/00 ; B01L3/00 ; B01L9/00

Abstract:
Disclosed are a sample inspection apparatus and a control method thereof. The sample inspection apparatus includes a housing, a cartridge insertable into one side of the housing and configured to receive a sample, a pressing member disposed within the housing and configured to press the cartridge to inspect the sample, a fluid storage part configured to transfer a fluid to the pressing member so that the pressing member presses the cartridge, and a fluid supply part configured to supply the fluid into the fluid storage part.
Public/Granted literature
- US20150212052A1 SAMPLE INSPECTION APPARATUS AND CONTROL METHOD THEREOF Public/Granted day:2015-07-30
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