Invention Grant
- Patent Title: Managing interconnect electromigration effects
- Patent Title (中): 管理互连电迁移效应
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Application No.: US14039047Application Date: 2013-09-27
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Publication No.: US09477568B2Publication Date: 2016-10-25
- Inventor: Malcolm S. Allen-Ware , Jon A. Casey , Sungjun Chun , Alan J. Drake , Charles R. Lefurgy , Karthick Rajamani , Jeonghee Shin , Thomas A. Wassick , Victor Zyuban
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Francis Lammes; Stephen J. Walder, Jr.; Parashos T. Kalaitzis
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F11/30 ; G06F11/07 ; G06F11/00

Abstract:
A mechanism is provided for determining a modeled age of a set of interconnect groups in a set of cores in a set of multi-core processors. For each interconnect group in the set of interconnect groups in the set of cores on the set of multi-core processors, a determination is made of a current modeled age of the interconnect group. A determination is then made as to whether at least one current modeled age of the interconnect group for the set of interconnect groups is greater than an end-of-life value. Responsive to at least one current modeled age of the interconnect group being greater than the end-of-life value, an indication to take corrective action with the at least one associated interconnect group is sent.
Public/Granted literature
- US20150094995A1 Managing Interconnect Electromigration Effects Public/Granted day:2015-04-02
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