LEAKAGE POWER CHARACTERIZATION AT HIGH TEMPERATURES FOR AN INTEGRATED CIRCUIT

    公开(公告)号:US20180372797A1

    公开(公告)日:2018-12-27

    申请号:US15989743

    申请日:2018-05-25

    IPC分类号: G01R31/30 G01R31/28

    摘要: A system for post-silicon leakage characterization is configured to apply a rail voltage to a hardware component; cause the hardware component to operate at a particular frequency; cause a cooling device, coupled to the hardware component, to operate at a cooling capacity; run a workload on the hardware component after applying the rail voltage, causing the hardware component to operate at a particular frequency, and causing the cooling device to operate at a particular cooling capacity; discontinue the workload and clocks of the hardware component after a temperature of the hardware component has reached a steady high point; continuously measure temperature and leakage power of the hardware component after discontinuing the workload until the temperature of the hardware component has reached a steady low point; and adjust a power management procedure for the hardware component based on measured temperature and measured leakage power of the hardware component.

    Dynamic Adjustment of Operational Parameters to Compensate for Sensor Based Measurements of Circuit Degradation
    7.
    发明申请
    Dynamic Adjustment of Operational Parameters to Compensate for Sensor Based Measurements of Circuit Degradation 有权
    动态调整操作参数以补偿基于传感器的电路退化测量

    公开(公告)号:US20150081039A1

    公开(公告)日:2015-03-19

    申请号:US14046056

    申请日:2013-10-04

    IPC分类号: G05B13/02

    CPC分类号: G05B13/024 G06F11/008

    摘要: A mechanism is provided for implementing an operational parameter change within the data processing system based on an identified degradation. One or more degradations existing in the data processing system are identified based on a set of degradation values obtained from a set of degradation sensors. A determination is made as to whether one or more operational parameters need to be modified based on the one or more identified degradations. Responsive to determining that the one or more operational parameters need to be modified based on the one or more identified degradations, an input change is implemented to a one or more control devices in order that the one or more operational parameters are modified.

    摘要翻译: 提供了一种用于基于所识别的劣化在数据处理系统内实现操作参数变化的机制。 基于从一组劣化传感器获得的一组劣化值来识别数据处理系统中存在的一个或多个劣化。 确定是否需要基于一个或多个所识别的退化来修改一个或多个操作参数。 响应于基于所述一个或多个所识别的劣化来确定所述一个或多个操作参数需要被修改,对一个或多个控制设备实施输入改变,以便修改所述一个或多个操作参数。

    Adaptive power capping in a chip
    10.
    发明授权

    公开(公告)号:US10048734B2

    公开(公告)日:2018-08-14

    申请号:US15831576

    申请日:2017-12-05

    IPC分类号: G06F1/32 G06F1/28 G06F9/44

    摘要: Adaptive power capping in a chip that includes a plurality of cores in a processing system is provided. An active power demand for the chip is dynamically determined based on observed events of the cores. An average temperature of the chip is computed using one or more on-chip thermal sensors in the cores to estimate leakage power of the chip. A power capping threshold that incorporates the estimate of leakage power is determined based on the average temperature of the chip. Power capping is performed by throttling the cores based on determining that the active power demand for the chip exceeds the power capping threshold.