Invention Grant
- Patent Title: Memory system and method of reading data thereof
- Patent Title (中): 存储器系统及其数据读取方法
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Application No.: US14312214Application Date: 2014-06-23
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Publication No.: US09478298B2Publication Date: 2016-10-25
- Inventor: Hyun-Ho Shin , Heung-Soo Lim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeongg-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeongg-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2013-0072708 20130624
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C16/26 ; G11C16/34 ; G11C29/52 ; G06F11/10

Abstract:
A method of reading data in a memory system including a non-volatile memory device, includes reading first data stored in a first block using a first read scheme capable of detecting/correcting an error in the first data, and upon determining an uncorrected error in the first data, setting the first block as a first temporary bad block and reading second data stored in the first temporary bad block using a second read scheme different from the first read scheme.
Public/Granted literature
- US20140380129A1 MEMORY SYSTEM AND METHOD OF READING DATA THEREOF Public/Granted day:2014-12-25
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