Invention Grant
- Patent Title: FinFET with dielectric isolation by silicon-on-nothing and method of fabrication
-
Application No.: US14529332Application Date: 2014-10-31
-
Publication No.: US09478549B2Publication Date: 2016-10-25
- Inventor: Kangguo Cheng , Balasubramanian S. Haran , Shom Ponoth , Theodorus Eduardus Standaert , Tenko Yamashita
- Applicant: GLOBALFOUNDRIES Inc.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee Address: KY Grand Cayman
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent George Blasiak
- Main IPC: H01L21/84
- IPC: H01L21/84 ; H01L27/108 ; H01L21/762 ; H01L27/12

Abstract:
An improved finFET and method of fabrication using a silicon-on-nothing process flow is disclosed. Nitride spacers protect the fin sides during formation of cavities underneath the fins for the silicon-on-nothing (SON) process. A flowable oxide fills the cavities to form an insulating dielectric layer under the fins.
Public/Granted literature
- US20150064855A1 FINFET WITH DIELECTRIC ISOLATION BY SILICON-ON-NOTHING AND METHOD OF FABRICATION Public/Granted day:2015-03-05
Information query
IPC分类: