发明授权
- 专利标题: Wavelength detector and wavelength calibration system
- 专利标题(中): 波长检测器和波长校准系统
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申请号: US13535641申请日: 2012-06-28
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公开(公告)号: US09478933B2公开(公告)日: 2016-10-25
- 发明人: Toru Suzuki , Shinichi Matsumoto
- 申请人: Toru Suzuki , Shinichi Matsumoto
- 申请人地址: JP Tochigi
- 专利权人: GIGAPHOTON INC.
- 当前专利权人: GIGAPHOTON INC.
- 当前专利权人地址: JP Tochigi
- 代理机构: Kratz, Quintos & Hanson, LLP
- 优先权: JP2011-150373 20110706; JP2012-113836 20120517
- 主分类号: H01S3/13
- IPC分类号: H01S3/13 ; G01J1/42 ; H01S3/137 ; H01S3/225 ; G01J9/00 ; G01J9/02 ; H01J47/00 ; H01S3/08 ; H01S3/10
摘要:
The wavelength detector includes a diffusion element that diffuses the laser beam; a light collection optical system provided downstream from the diffusion element; a member, including an aperture, provided downstream from the light collection optical system; a discharge tube that is provided downstream from the member and that includes a cylindrical anode and a cylindrical cathode that each have a through-hole formed therein, and that is configured so that an electrical property between the anode and the cathode changes due to an opto-galvanic effect when a laser beam having a predetermined wavelength passes through the through-hole of the cathode in a state in which a DC voltage is applied to the anode; and a high-voltage DC power source. The discharge tube is disposed so that the laser beam that passes through the aperture passes through the through-hole of the cathode of the discharge tube without directly irradiating the cathode.
公开/授权文献
- US20130170508A1 WAVELENGTH DETECTOR AND WAVELENGTH CALIBRATION SYSTEM 公开/授权日:2013-07-04
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