发明授权
- 专利标题: Material erosion monitoring system and method
- 专利标题(中): 材料侵蚀监测系统及方法
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申请号: US14226102申请日: 2014-03-26
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公开(公告)号: US09488601B2公开(公告)日: 2016-11-08
- 发明人: Alexander C. Ruege , Yakup Bayram , Eric K. Walton
- 申请人: PaneraTech, Inc.
- 申请人地址: US VA Chantilly
- 专利权人: PANERATECH, INC.
- 当前专利权人: PANERATECH, INC.
- 当前专利权人地址: US VA Chantilly
- 代理机构: Whiteford, Taylor & Preston, LLP
- 代理商 Gregory M. Stone
- 主分类号: G01N17/02
- IPC分类号: G01N17/02 ; G01B7/06 ; G01N27/61 ; G01N22/02 ; G01B15/02 ; F27D21/00
摘要:
Disclosed is an improved system and method to evaluate the status of a material. The system and method are operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials, using electromagnetic waves. The system is designed to reduce a plurality of reflections, associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities of the material. Furthermore, the system and method utilize a configuration and signal processing techniques that reduce clutter and enable the isolation of electromagnetic waves of interest. Moreover, the launcher is impedance matched to the material under evaluation, and the feeding mechanism is designed to mitigate multiple reflection effects to further suppress clutter.
公开/授权文献
- US20150276577A1 MATERIAL EROSION MONITORING SYSTEM AND METHOD 公开/授权日:2015-10-01
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