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公开(公告)号：US20220196396A1
公开(公告)日：2022-06-23
申请号：US17553903
申请日：2021-12-17
申请人： PaneraTech, Inc.
发明人： Yakup Bayram
摘要： Disclosed is a system and method for evaluating a status of a refractory material in metallurgical vessels, including furnaces and ladles, wherein a slag buildup is formed on the surface of such material as a result of scrap accumulation and chemical reactions occurring during the melting of metals in such vessels. The system and method are operative to determine both a rate of degradation of the material under evaluation, including the thickness of such material, and a measure of the slag buildup to predict and extend the operational life and improve the maintenance plan of the vessel. The system is capable of determining the thickness of and the slag buildup on the entire material under evaluation by sampling a number of regions of such material with different types of sensors, characterizing the surface profile of such material, and using appropriate signal processing techniques and artificial intelligence algorithms.
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公开(公告)号：US10151709B2
公开(公告)日：2018-12-11
申请号：US14732831
申请日：2015-06-08
申请人： PaneraTech, Inc.
发明人： Yakup Bayram , Alexander Ruege , Eric Walton , Peter Hagan
摘要： Disclosed is an improved device and method to evaluate the status of a material by scanning an area that overlaps a region of the material under evaluation. The device and method are operative to identify a leakage of a first material into a second material, such as a molten material surrounded by a refractory material, to measure the thickness of the second material, using electromagnetic waves, and to generate images. The device is designed to reduce a plurality of reflections associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities present in between the device and the enclosed material. Furthermore, the device can be configured to scan areas of interest in either a portable or fixed configuration, manually in a standalone mode or as part of an automated system.
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公开(公告)号：US09255794B2
公开(公告)日：2016-02-09
申请号：US13706787
申请日：2012-12-06
申请人： PaneraTech, Inc.
发明人： Eric Walton , Yakup Bayram
CPC分类号： G01B15/02 , F27D21/0021 , G01N22/02 , G06F15/00
摘要： Disclosed is a system and method to aid in these inspections that avoid the disadvantages of the prior art. The system and method are operative to take thickness measurements of, and thus evaluate the condition of, materials including but not limited to refractory materials, operating in frequency bands that result in less loss than previously known technologies, and utilizing a system configuration and signal processing techniques that isolate the reflected signal of interest from other spurious antenna reflections, particularly by creating (through the configuration of the antenna assembly) a time delay between such spurious reflections and the actual reflected signal of interest, thus enabling better isolation of the signal of interest. Still further, the antenna assembly is intrinsically matched to the material to be probed, such as by impedance matching the antenna to the particular material (through knowledge of the dielectric and magnetic properties of the material to be evaluated) to even further suppress spurious reflections.
摘要翻译： 公开了一种帮助这些检查的系统和方法，以避免现有技术的缺点。 该系统和方法可操作以进行厚度测量，并且因此评价包括但不限于耐火材料的材料的状态，其在频带中操作，导致比先前已知技术更少的损耗，并且利用系统配置和信号处理 特别是通过产生（通过天线组合的配置）这种寄生反射与感兴趣的实际反射信号之间的时间延迟，从而使感兴趣的信号更好地隔离，从而将感兴趣的反射信号与其他假天线反射隔离开来的技术 。 此外，天线组件本质上与要探测的材料匹配，例如通过将天线与特定材料的阻抗匹配（通过了解待评估材料的介电和磁特性），以进一步抑制寄生反射。
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公开(公告)号：US20150362439A1
公开(公告)日：2015-12-17
申请号：US14732831
申请日：2015-06-08
申请人： PaneraTech, Inc.
发明人： Yakup Bayram , Alexander Ruege , Eric Walton , Peter Hagan
摘要： Disclosed is an improved device and method to evaluate the status of a material by scanning an area that overlaps a region of the material under evaluation. The device and method are operative to identify a leakage of a first material into a second material, such as a molten material surrounded by a refractory material, to measure the thickness of the second material, using electromagnetic waves, and to generate images. The device is designed to reduce a plurality of reflections associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities present in between the device and the enclosed material. Furthermore, the device can be configured to scan areas of interest in either a portable or fixed configuration, manually in a standalone mode or as part of an automated system.
摘要翻译： 公开了一种通过扫描与被评估材料的区域重叠的区域来评估材料状态的改进的装置和方法。 该装置和方法用于识别第一材料泄漏到第二材料（例如由耐火材料包围的熔融材料）中，以使用电磁波测量第二材料的厚度并产生图像。 该装置被设计成减少与发射到被评估材料中的电磁波的传播相关联的多个反射足够的程度，以便能够检测出存在于装置和封闭件之间的远程不连续性的感兴趣的电磁波 材料。 此外，该设备可以被配置为以便携式或固定配置扫描感兴趣的区域，手动地以独立模式或作为自动化系统的一部分。
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公开(公告)号：US20230289625A1
公开(公告)日：2023-09-14
申请号：US18181601
申请日：2023-03-10
申请人： PaneraTech, Inc.
发明人： Yakup Bayram
CPC分类号： G06N5/022 , G01B11/06 , F27D21/0021
摘要： Disclosed is a system and a method for estimating a level of risk of operation of a metallurgical vessel used in the formation of metals. The system and method are operative to determine a condition and level of degradation of the refractory material of the vessel to early warn a user of the operational risk of continuing operating the vessel, based on thermal scanning and the use of artificial intelligence. The system is capable of determining the presence of certain flaws within the refractory material and the remaining thickness of such material by correlating the results of processing thermal data corresponding to the external surface of the vessel with a machine learning-based mathematical model, according to a set of operational parameters related to the melting process, data from the user, and residual thickness of the refractory material.
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6.发明公开公开(公告)号：US20230152243A1
公开(公告)日：2023-05-18
申请号：US17916895
申请日：2021-04-05
申请人： PaneraTech, Inc.
发明人： YAKUP BAYRAM
摘要： Disclosed is an apparatus and method for evaluating a status of a refractory material in metallurgical vessels, including furnaces and ladles, wherein an external structure at least partly surrounding the refractory material impairs the propagation of radiofrequency signals. The apparatus and method are operative to identify flaws and determine the erosion profile and thickness of refractory material and the level or rate of penetration of molten material into the refractory material, using radiofrequency signals. The apparatus comprises an antenna embedded in the refractory material or positioned inside the chamber of the vessel designed to collect data associated with the propagation of radiofrequency signals transmitted by the antenna into the refractory material. Moreover, signal processing techniques allow determining the status of the internal wall of the vessel due to operational wear, age, and presence of flaws, cracks, corrosion, and erosion to improve the operational life and maintenance of the vessel.
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公开(公告)号：US20170234808A1
公开(公告)日：2017-08-17
申请号：US15346161
申请日：2016-11-08
申请人： PaneraTech, Inc.
发明人： Alexander C. Ruege , Yakup Bayram
CPC分类号： G01N22/02 , F27D21/0021 , G01B15/02 , G01N33/386 , G01N33/388
摘要： Disclosed is an improved system and method to evaluate the status of a material. The system and method are operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials, using electromagnetic waves. The system is designed to reduce a plurality of reflections, associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities of the material. Furthermore, the system and method utilize a configuration and signal processing techniques that reduce clutter and enable the isolation of electromagnetic waves of interest. Moreover, the launcher is impedance matched to the material under evaluation, and the feeding mechanism is designed to mitigate multiple reflection effects to further suppress clutter.
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公开(公告)号：US09413059B2
公开(公告)日：2016-08-09
申请号：US14275157
申请日：2014-05-12
申请人： PaneraTech, Inc.
摘要： Disclosed is an antenna feeding system and method to optimize the design of the feeding system to feed an antenna made of a resistive sheet. The system and method are operative to design a topology of the antenna feeding system to adapt to a topology of the resistive sheet antenna to mitigate the adverse effects caused by the inherent losses of resistive sheets while operating as antennas. The system is designed to reduce a convergence of radiofrequency currents that may create a localized high density current concentration, such as “hot spots” and “pinch points,” on the resistive sheet, by a sufficient extent so as to prevent power losses that substantially decrease the radiation efficiency of the antenna as compared with feeding systems designed using traditional design techniques.
摘要翻译： 公开了一种天线馈送系统和方法，用于优化馈送系统的设计以馈送由电阻片制成的天线。 该系统和方法可操作以设计天线馈电系统的拓扑结构，以适应电阻式薄片天线的拓扑结构，以减轻由作为天线的电阻薄片固有损耗引起的不利影响。 该系统旨在减少射频电流的收敛，其可以在电阻板上产生局部高密度电流集中，例如“热点”和“夹点”，达到足够的程度，以便防止基本上 与使用传统设计技术设计的馈送系统相比，降低了天线的辐射效率。
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公开(公告)号：US20140340279A1
公开(公告)日：2014-11-20
申请号：US14275157
申请日：2014-05-12
申请人： PaneraTech, Inc.
摘要： Disclosed is an antenna feeding system and method to optimize the design of the feeding system to feed an antenna made of a resistive sheet. The system and method are operative to design a topology of the antenna feeding system to adapt to a topology of the resistive sheet antenna to mitigate the adverse effects caused by the inherent losses of resistive sheets while operating as antennas. The system is designed to reduce a convergence of radiofrequency currents that may create a localized high density current concentration, such as “hot spots” and “pinch points,” on the resistive sheet, by a sufficient extent so as to prevent power losses that substantially decrease the radiation efficiency of the antenna as compared with feeding systems designed using traditional design techniques.
摘要翻译： 公开了一种天线馈电系统和方法，用于优化馈电系统的设计以馈送由电阻片制成的天线。 该系统和方法可操作以设计天线馈电系统的拓扑结构，以适应电阻式薄片天线的拓扑结构，以减轻由作为天线的电阻薄片固有损耗引起的不利影响。 该系统旨在减少射频电流的收敛，其可以在电阻板上产生局部高密度电流集中，例如“热点”和“夹点”，达到足够的程度，以便防止基本上 与使用传统设计技术设计的馈送系统相比，降低了天线的辐射效率。
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公开(公告)号：US09880110B2
公开(公告)日：2018-01-30
申请号：US15346161
申请日：2016-11-08
申请人： PaneraTech, Inc.
发明人： Alexander C. Ruege , Yakup Bayram
CPC分类号： G01N22/02 , F27D21/0021 , G01B15/02 , G01N33/386 , G01N33/388
摘要： Disclosed is an improved system and method to evaluate the status of a material. The system and method are operative to identify flaws and measure the erosion profile and thickness of different materials, including refractory materials, using electromagnetic waves. The system is designed to reduce a plurality of reflections, associated with the propagation of electromagnetic waves launched into the material under evaluation, by a sufficient extent so as to enable detection of electromagnetic waves of interest reflected from remote discontinuities of the material. Furthermore, the system and method utilize a configuration and signal processing techniques that reduce clutter and enable the isolation of electromagnetic waves of interest. Moreover, the launcher is impedance matched to the material under evaluation, and the feeding mechanism is designed to mitigate multiple reflection effects to further suppress clutter.
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