Invention Grant
US09489257B2 Correcting soft reliability measures of storage values read from memory cells
有权
更正从存储单元读取的存储值的软可靠性度量
- Patent Title: Correcting soft reliability measures of storage values read from memory cells
- Patent Title (中): 更正从存储单元读取的存储值的软可靠性度量
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Application No.: US14499207Application Date: 2014-09-28
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Publication No.: US09489257B2Publication Date: 2016-11-08
- Inventor: Tomer Ish-Shalom , Eyal Gurgi , Moti Teitel
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G06F11/10 ; G11C29/52 ; H03M13/45

Abstract:
A method for data storage includes reading storage values, which represent stored data, from a group of memory cells using read thresholds, and deriving respective soft reliability metrics for the storage values. The storage values are classified into two or more subgroups based on a predefined classification criterion. Independently within each subgroup, a subgroup-specific distribution of the storage values in the subgroup is estimated, and the soft reliability metrics of the storage values in the subgroup are corrected based on the subgroup-specific distribution. The stored data is decoded using the corrected soft reliability metrics.
Public/Granted literature
- US20160092301A1 CORRECTING SOFT RELIABILITY MEASURES OF STORAGE VALUES READ FROM MEMORY CELLS Public/Granted day:2016-03-31
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