Identifying a failing group of memory cells in a multi-plane storage operation

    公开(公告)号:US10248515B2

    公开(公告)日:2019-04-02

    申请号:US15409583

    申请日:2017-01-19

    申请人: Apple Inc.

    摘要: An apparatus includes an interface and storage circuitry. The interface is configured to communicate with a memory that includes multiple memory cells arranged in multiple planes that each includes one or more blocks of the memory cells. The storage circuitry is configured to apply a multi-plane storage operation to multiple blocks simultaneously across the respective planes. In response to detecting that the multi-plane storage operation has failed, the storage circuitry is configured to apply a single-plane storage operation to one or more of the blocks that were accessed in the multi-plane storage operation, including a given block, and to identify the given block as a bad block if the single-plane operation applied to the given block fails. The storage circuitry is further configured to store data in the blocks that were accessed in the multi-plane operation but were not identified as bad blocks.

    Classifying Memory Cells to Multiple Impairment Profiles Based on Readout Bit-Flip Counts

    公开(公告)号:US20180075926A1

    公开(公告)日:2018-03-15

    申请号:US15810166

    申请日:2017-11-13

    申请人: Apple Inc.

    IPC分类号: G11C29/44 G11C29/38

    摘要: A storage apparatus includes a plurality of memory cells and storage circuitry. The storage circuitry is configured to store a mapping that maps sets of readout bit-flip counts to respective predefined impairment profiles. The impairment profiles specify two or more severity levels of respective impairment types, including read disturb, retention and endurance. Each of the bit-flip counts includes a one-to-zero error count or a zero-to-one error count. The storage circuitry is configured to read data from a group of the memory cells using given readout parameters, to evaluate an actual set of bit-flip counts corresponding to the read data, to classify the group of the memory cells to a respective impairment profile by mapping the actual set of the bit-flip counts using the mapping, and to adapt the readout parameters based on the impairment profile to which the group of the memory cells was classified.

    Classifying memory cells to multiple impairment profiles based on readout bit-flip counts

    公开(公告)号:US09847141B1

    公开(公告)日:2017-12-19

    申请号:US15225863

    申请日:2016-08-02

    申请人: APPLE INC.

    摘要: A storage apparatus includes a plurality of memory cells and storage circuitry. The storage circuitry is configured to store a mapping that maps sets of readout bit-flip counts to respective predefined impairment profiles. The impairment profiles specify two or more severity levels of respective impairment types, including read disturb, retention and endurance. Each of the bit-flip counts includes a one-to-zero error count or a zero-to-one error count. The storage circuitry is configured to read data from a group of the memory cells using given readout parameters, to evaluate an actual set of bit-flip counts corresponding to the read data, to classify the group of the memory cells to a respective impairment profile by mapping the actual set of the bit-flip counts using the mapping, and to adapt the readout parameters based on the impairment profile to which the group of the memory cells was classified.

    Early prediction of failure in programming a nonvolatile memory
    8.
    发明授权
    Early prediction of failure in programming a nonvolatile memory 有权
    早期预测非易失性存储器编程失败

    公开(公告)号:US09595343B1

    公开(公告)日:2017-03-14

    申请号:US15173655

    申请日:2016-06-05

    申请人: Apple Inc.

    摘要: A storage device includes multiple memory cells and storage circuitry. The storage circuitry is configured to write data to a group of the memory cells by applying to the group of the memory cells up to a maximal number of programming pulses. The storage circuitry is further configured to evaluate, after applying less than the maximal number of programming pulses, a criterion that predicts whether or not the data will be written successfully within the maximal number of programming pulses, and when the criterion predicts that writing the data will fail, to perform a corrective operation.

    摘要翻译: 存储设备包括多个存储器单元和存储电路。 存储电路被配置为通过将最多数量的编程脉冲施加到存储器单元组来将数据写入一组存储器单元。 存储电路还被配置为在应用小于编程脉冲的最大数量之后评估一种标准,该标准预测数据是否将在最大编程脉冲数内成功写入,并且当标准预测写数据时 将失败,执行纠正操作。

    Estimating flash quality using selective error emphasis
    9.
    发明授权
    Estimating flash quality using selective error emphasis 有权
    使用选择性错误强调估算闪光质量

    公开(公告)号:US09594615B2

    公开(公告)日:2017-03-14

    申请号:US14501081

    申请日:2014-09-30

    申请人: APPLE INC.

    摘要: A method for data storage includes reading from a memory device data that is stored in a group of memory cells as respective analog values, and classifying readout errors in the read data into at least first and second different types, depending on zones in which the analog values fall. A memory quality that emphasizes the readout errors of the second type is assigned to the group of the memory cells, based on evaluated numbers of the readout errors of the first and second types.

    摘要翻译: 一种用于数据存储的方法包括:从存储器件读取作为相应模拟值存储在一组存储器单元中的数据,并将读出的数据中的读出错误分类为至少第一和第二不同类型,这取决于模拟 价值下降。 基于第一和第二类型的读出错误的评估数,将强调第二类型的读出错误的存储器质量分配给存储器单元组。

    Correcting soft reliability measures of storage values read from memory cells
    10.
    发明授权
    Correcting soft reliability measures of storage values read from memory cells 有权
    更正从存储单元读取的存储值的软可靠性度量

    公开(公告)号:US09489257B2

    公开(公告)日:2016-11-08

    申请号:US14499207

    申请日:2014-09-28

    申请人: Apple Inc.

    摘要: A method for data storage includes reading storage values, which represent stored data, from a group of memory cells using read thresholds, and deriving respective soft reliability metrics for the storage values. The storage values are classified into two or more subgroups based on a predefined classification criterion. Independently within each subgroup, a subgroup-specific distribution of the storage values in the subgroup is estimated, and the soft reliability metrics of the storage values in the subgroup are corrected based on the subgroup-specific distribution. The stored data is decoded using the corrected soft reliability metrics.

    摘要翻译: 一种用于数据存储的方法包括:使用读取阈值从一组存储器单元读取表示存储数据的存储值,以及导出用于存储值的相应的软可靠性度量。 基于预定义的分类标准将存储值分类为两个或更多个子组。 在每个子组内独立地估计子组中存储值的子组特定分布,并且基于子组特定分布来校正子组中的存储值的软可靠性度量。 使用校正的软可靠性度量对存储的数据进行解码。