Invention Grant
- Patent Title: Multiple via structure and method
- Patent Title (中): 多通道结构和方法
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Application No.: US13940874Application Date: 2013-07-12
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Publication No.: US09508640B2Publication Date: 2016-11-29
- Inventor: Cheng-Wei Cheng , Szu-Lin Cheng , Keith E. Fogel , Edward W. Kiewra , Amlan Majumdar , Devendra K. Sadana , Kuen-Ting Shiu , Yanning Sun
- Applicant: GLOBALFOUNDRIES INC.
- Applicant Address: KY Grand Cayman
- Assignee: GlobalFoundries, Inc.
- Current Assignee: GlobalFoundries, Inc.
- Current Assignee Address: KY Grand Cayman
- Agency: Hoffman Warnick LLC
- Agent Michael Le Strange
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L23/522 ; H01L23/485 ; H01L21/8238 ; H01L27/12

Abstract:
A method for forming a device with a multi-tiered contact structure includes forming first contacts in via holes down to a first level, forming a dielectric capping layer over exposed portions of the first contacts and forming a dielectric layer over the capping layer. Via holes are opened in the dielectric layer down to the capping layer. Holes are opened in the capping layer through the via holes to expose the first contacts. Contact connectors and second contacts are formed in the via holes such that the first and second contacts are connected through the capping layer by the contact connectors to form multi-tiered contacts.
Public/Granted literature
- US20150014778A1 MULTIPLE VIA STRUCTURE AND METHOD Public/Granted day:2015-01-15
Information query
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