Invention Grant
- Patent Title: Poly resistor for metal gate integrated circuits
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Application No.: US14569932Application Date: 2014-12-15
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Publication No.: US09508708B2Publication Date: 2016-11-29
- Inventor: Kamel Benaissa
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Jacqueline J. Garner; Frank D. Cimino
- Main IPC: H01L27/06
- IPC: H01L27/06 ; H01L27/11 ; H01L27/02 ; H01L49/02 ; H01L29/43 ; H01L29/49 ; H01L29/51 ; H01L29/66 ; H01L29/78

Abstract:
An integrated circuit containing a metal gate transistor and a thin polysilicon resistor may be formed by forming a first layer of polysilicon and removed it in an area for the thin polysilicon resistor. A second layer of polysilicon is formed over the first layer of polysilicon and in the area for the thin polysilicon resistor. The thin polysilicon resistor is formed in the second layer of polysilicon and the sacrificial gate is formed in the first layer of polysilicon and the second layer of polysilicon. A PMD layer is formed over the second layer of polysilicon and a top portion of the PMD layer is removed so as to expose the sacrificial gate but not expose the second layer of polysilicon in the thin polysilicon resistor. The sacrificial gate is removed and a metal replacement gate is formed.
Public/Granted literature
- US20150171077A1 POLY RESISTOR FOR METAL GATE INTEGRATED CIRCUITS Public/Granted day:2015-06-18
Information query
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